冷熱沖(chong)擊(ji)試(shi)(shi)驗箱(xiang)用于(yu)電(dian)子電(dian)器(qi)零組(zu)(zu)件、自動化(hua)(hua)零部件、通訊組(zu)(zu)件、汽(qi)車(che)配(pei)件、金屬、化(hua)(hua)學(xue)材(cai)料(liao)、塑膠等行(xing)業，國防工(gong)業、航(hang)天、兵(bing)工(gong)業、BGA、PCB基扳、電(dian)子芯(xin)片IC、半導體(ti)陶磁及高(gao)(gao)分子材(cai)料(liao)之物理牲變化(hua)(hua)，測試(shi)(shi)其材(cai)料(liao)對(dui)高(gao)(gao)、低溫的反復抵拉力及產品(pin)(pin)(pin)于(yu)熱脹冷縮產出的化(hua)(hua)學(xue)變化(hua)(hua)或物理傷(shang)害(hai)，可確認產品(pin)(pin)(pin)的品(pin)(pin)(pin)質，從精密(mi)的IC到重機械(xie)的組(zu)(zu)件，都會用到，是各領(ling)域對(dui)產品(pin)(pin)(pin)測試(shi)(shi)的*的一項測試(shi)(shi)箱(xiang)。

     高低溫(wen)(wen)(wen)沖(chong)(chong)(chong)擊試驗(yan)機(ji)分(fen)為(wei)高溫(wen)(wen)(wen)箱，低溫(wen)(wen)(wen)箱，測(ce)試箱三(san)部分(fen)，采*之(zhi)斷熱(re)(re)結構(gou)及蓄熱(re)(re)蓄冷(leng)效果，試驗(yan)時待測(ce)物(wu)*靜止，應用冷(leng)熱(re)(re)風路切(qie)換方式(shi)將冷(leng)，熱(re)(re)溫(wen)(wen)(wen)度(du)(du)導入測(ce)試區(qu)實現冷(leng)熱(re)(re)沖(chong)(chong)(chong)擊測(ce)試目(mu)的。可(ke)獨立設(she)定(ding)高溫(wen)(wen)(wen)、低溫(wen)(wen)(wen)及冷(leng)熱(re)(re)沖(chong)(chong)(chong)擊三(san)種(zhong)不同條件之(zhi)功能(neng)(neng)，并于執行冷(leng)熱(re)(re)沖(chong)(chong)(chong)擊條件時，可(ke)選(xuan)擇二槽(cao)式(shi)或三(san)槽(cao)式(shi)及冷(leng)沖(chong)(chong)(chong)、熱(re)(re)沖(chong)(chong)(chong)進行沖(chong)(chong)(chong)擊之(zhi)功能(neng)(neng)，具備高低溫(wen)(wen)(wen)試驗(yan)機(ji)的功能(neng)(neng)。具備全自(zi)動，高精(jing)密系統回路、任一(yi)機(ji)件動作，*有P.L.C鎖定(ding)處(chu)理，全部采用P.I.D自(zi)動演算控(kong)制,溫(wen)(wen)(wen)度(du)(du)控(kong)制精(jing)度(du)(du)高。